SBASSE faculty, Dr. Salman Noshear Arshad and Senior Research Scientist, Dr. Murtaza Saleem, attended the FEI NovaNanoSEM course at the FEI NanoPort in Eindhoven, the Netherlands (November 23 – 25, 2015).
FEI is one of the leading manufacturers and suppliers of high performance electron and ion beam microscopes. Last year, SBASSE acquired their top of the line electron microscope system (FEI Nova NanoSEM 450) which is also equipped with Oxford’s energy dispersive x-ray detector for compositional analysis and Raith’s e-beam lithography system for pattern generation. The microscope has a resolution of ~0.8 nanometer and can be used for morphological and compositional analysis of a diverse range of samples in life sciences, physics, chemistry, materials science and electronics disciplines etc. The course was very useful to learn new tools and skills to operate SBASSE’s scanning electron microscope for state-of-the-art imaging and analytical performance and will further strengthen the school’s teaching and research capabilities. The images show some samples analysed during the course.
